Practice-oriented and working in small groups, Hamm-Lippstadt University of Applied Sciences offers high-quality degree programs with a clear orientation on current and future market requirements. The young team of professors is practically experienced. With an interdisciplinary setup, teaching focuses on both the promotion of individual strength and the imparting of social competences.

Supervising professor
Prof. Dr.-Ing. Ali Hayek studied electrical engineering and information technology at the Technical University of Darmstadt and completed his doctorate at the Institute for Computer Architecture and System Programming at the University of Kassel.
Throughout his career, he has focused on the development of safety-related integrated computer architectures on application-specific integrated circuits (ASICs). He began in the industry as a project manager for ASIC design at HIMA, specializing in safety-related embedded systems. Progressing to a senior expert and managerial role, he continued to excel in this field.
In November 2021, he was appointed as a Professor of Hardware Engineering at the Hamm-Lippstadt University of Applied Sciences (HSHL). Alongside his teaching activities, he serves as a guest lecturer at various universities, is author and reviewer of various scientific publications and participates in multiple working groups related to research and standardization.

Abstract
This presentation explores the interplay between FPGAs and modern safety controllers. Beginning with background concepts on Functional Safety, it examines the impact of digitization on safety protocols, and highlights the central role of safety controllers in the digital age. Addressing some practical aspects of implementing digitalized Functional Safety, the presentation discusses some of the challenges of implementing FPGAs as safety controllers, such as scalability and complexity, interoperability, isolation and redundancy.
The work provides insightful perspectives to exploit the potential of digitization in Functional Safety.

Abstract
This presentation addresses the critical interface between radiation, semiconductor devices and the potential errors occurring in electronic systems. Starting with an overview of ISO 26262, the international standard for Functional Safety in the automotive industry, it navigates through the semiconductor fault models and examines the effects of radiation on semiconductor devices.
The audience gains insights into the various types of errors induced by radiation and their potential to disrupt the normal function of electronic components.

Abstract
This presentation explores the topic of mitigating transient faults in embedded applications. Beginning with a definition of Functional Safety, it delves into various ways of mitigation, covering techniques such as error prevention, error detection, and error correction.
The audience gains an understanding of soft errors and their significant impact on the Functional Safety of embedded electronic systems.

Abstract
This presentation addresses the role of field-programmable gate arrays (FPGAs) in safety-critical applications and considers the motivations and background for their deployment. After an overview of the functional safety standards that apply to FPGA-based systems, it addresses the key safety challenges for FPGA-based designs and investigates potential risks and mitigation strategies.
The audience gains insights into some FPGA tools that include documentation, reliability reports, scripts and notes, no less important for the special requirements of safety-critical applications.